Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity

C. J. Sun; G. M. Chow; Jianping Wang; E. W. Soo; J. H. Je

doi:10.1109/INTMAG.2002.1001467

Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity

C. J. Sun, G. M. Chow, Jianping Wang, E. W. Soo, J. H. Je

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

CoCrPt films with Ti underlayer have been widely investigated as candidate media for perpendicular recording. The growth of Co alloy is interfacially controlled by the Ti underlayer. Although the engineering effects of Ti underlayer with magnetic properties of CoCrPt film are known, a combined understanding of the effects of crystallographic texture and interface roughness of CoCrPt/Ti films on magnetic properties is yet unclear. In this work, Co₇₄Cr₁₆Pt₁₀/Ti films were deposited using DC magnetron sputtering and examined by x-ray scattering and x-ray reflectivity.

Original language	English (US)
Title of host publication	INTERMAG Europe 2002 - IEEE International Magnetics Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	0780373650, 9780780373655
DOIs	https://doi.org/10.1109/INTMAG.2002.1001467
State	Published - Jan 1 2002
Externally published	Yes
Event	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands Duration: Apr 28 2002 → May 2 2002

Other

Other	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
Country/Territory	Netherlands
City	Amsterdam
Period	4/28/02 → 5/2/02

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Sun, C. J., Chow, G. M., Wang, J., Soo, E. W., & Je, J. H. (2002). Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity. In INTERMAG Europe 2002 - IEEE International Magnetics Conference Article 1001467 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2002.1001467

Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity. / Sun, C. J.; Chow, G. M.; Wang, Jianping et al.
INTERMAG Europe 2002 - IEEE International Magnetics Conference. Institute of Electrical and Electronics Engineers Inc., 2002. 1001467.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Sun, CJ, Chow, GM, Wang, J, Soo, EW & Je, JH 2002, Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity. in INTERMAG Europe 2002 - IEEE International Magnetics Conference., 1001467, Institute of Electrical and Electronics Engineers Inc., 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002, Amsterdam, Netherlands, 4/28/02. https://doi.org/10.1109/INTMAG.2002.1001467

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abstract = "CoCrPt films with Ti underlayer have been widely investigated as candidate media for perpendicular recording. The growth of Co alloy is interfacially controlled by the Ti underlayer. Although the engineering effects of Ti underlayer with magnetic properties of CoCrPt film are known, a combined understanding of the effects of crystallographic texture and interface roughness of CoCrPt/Ti films on magnetic properties is yet unclear. In this work, Co74Cr16Pt10/Ti films were deposited using DC magnetron sputtering and examined by x-ray scattering and x-ray reflectivity.",

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AU - Soo, E. W.

AU - Je, J. H.

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N2 - CoCrPt films with Ti underlayer have been widely investigated as candidate media for perpendicular recording. The growth of Co alloy is interfacially controlled by the Ti underlayer. Although the engineering effects of Ti underlayer with magnetic properties of CoCrPt film are known, a combined understanding of the effects of crystallographic texture and interface roughness of CoCrPt/Ti films on magnetic properties is yet unclear. In this work, Co74Cr16Pt10/Ti films were deposited using DC magnetron sputtering and examined by x-ray scattering and x-ray reflectivity.

AB - CoCrPt films with Ti underlayer have been widely investigated as candidate media for perpendicular recording. The growth of Co alloy is interfacially controlled by the Ti underlayer. Although the engineering effects of Ti underlayer with magnetic properties of CoCrPt film are known, a combined understanding of the effects of crystallographic texture and interface roughness of CoCrPt/Ti films on magnetic properties is yet unclear. In this work, Co74Cr16Pt10/Ti films were deposited using DC magnetron sputtering and examined by x-ray scattering and x-ray reflectivity.

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Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity

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