Tradeoffs between gate oxide leakage and delay for dual T ox circuits

Anup Kumar Sultania, Dennis Sylvester, Sachin S. Sapatnekar

Research output: Contribution to journalConference articlepeer-review

37 Scopus citations

Fingerprint

Dive into the research topics of 'Tradeoffs between gate oxide leakage and delay for dual T ox circuits'. Together they form a unique fingerprint.

Engineering & Materials Science