Engineering & Materials Science
Networks (circuits)
100%
Static random access storage
72%
Electric potential
61%
Transistors
51%
Negative bias temperature instability
44%
Degradation
36%
Dynamic random access storage
33%
Electromigration
31%
Leakage currents
30%
Threshold voltage
30%
Aging of materials
29%
Capacitors
27%
Data storage equipment
24%
Temperature
24%
Hardware security
23%
Silicon
23%
Tunnel junctions
23%
Clocks
22%
Digital circuits
21%
Flash memory
20%
Metals
18%
Electric power utilization
17%
Sampling
17%
Phase locked loops
16%
Sensors
16%
Macros
14%
Oxides
14%
Hot carriers
13%
Photoplethysmography
11%
Bit error rate
11%
Flip flop circuits
11%
Gate dielectrics
11%
Spintronics
11%
Electric breakdown
11%
Electric power systems
11%
Carbon nanotubes
10%
Decision feedback equalizers
10%
FinFET
10%
Recovery
10%
Energy efficiency
10%
Switches
10%
Integrated circuits
10%
Microprocessor chips
9%
Cache memory
9%
Single-walled carbon nanotubes (SWCN)
9%
Sleep
9%
Neural networks
9%
Computer hardware
9%
Scalability
9%
Physics & Astronomy
logic
15%
chips
11%
carbon nanotubes
9%
transistors
8%
oscillators
8%
rings
7%
CMOS
6%
inverters
5%
random numbers
5%
integrated circuits
5%
