TY - BOOK
T1 - Atomic Force Microscopy
T2 - Understanding Basic Modes and Advanced Applications
AU - Haugstad, Greg
PY - 2012/8/24
Y1 - 2012/8/24
N2 - This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. "Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com".
AB - This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. "Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com".
UR - http://www.scopus.com/inward/record.url?scp=84891583301&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84891583301&partnerID=8YFLogxK
U2 - 10.1002/9781118360668
DO - 10.1002/9781118360668
M3 - Book
AN - SCOPUS:84891583301
SN - 9780470638828
BT - Atomic Force Microscopy
PB - John Wiley and Sons
ER -