Enhanced Electrical Resistivity and Properties via Ion Bombardment of Ferroelectric Thin Films

Sahar Saremi, Ruijuan Xu, Liv R. Dedon, Julia A. Mundy, Shang Lin Hsu, Zuhuang Chen, Anoop R. Damodaran, Scott P. Chapman, Joseph T. Evans, Lane W. Martin

Research output: Contribution to journal › Article › peer-review