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Heterostructure FET Model Including Gate Leakage
P. Paul Ruden
Research output
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Contribution to journal
›
Article
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peer-review
14
Scopus citations
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Engineering & Materials Science
Gates (transistor)
100%
Heterojunctions
91%
Field effect transistors
75%
Analytical models
29%
Chemical Compounds
Field Effect
69%
Velocity
59%
Application
22%