Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

Saurabh Kumar, Minki Cho, Luke Everson, Hoonki Kim, Qianying Tang, Paul Mazanec, Pascal Meinerzhagen, Andres Malavasi, Dan Lake, Carlos Tokunaga, Heather Quinn, Muhammad Khellah, James Tschanz, Shekhar Borkar, Vivek De, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Scopus citations

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Engineering & Materials Science